Monday, November 28, 2016

Angstrom Advanced AA5000 Multi-function SPM Systems


AA5000 Multi-function SPM Systems
Introductions
AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.
Features
Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
SPM can be in liquid;
Real-time temperature and humidity detecting;
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
Fast automatically tip-engaging
Simply change of the tip holder to switch between STM and AFM;
Full digital control, auto system status recognition;
Adjustable lightening inside
With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
Controller and Computer connected through a 10M/100M Fast Ethernet;
Large sample size: up to diameter 45mm, 30mm thick;
Online Control Software and offline Image Processing Software for Windows;
Trace-Retrace scan, Back-Forward scan;
Online real-time 3D image;
Automatically Brightness and Contrast refresh;
Data can be loaded out for further analysis;
Nano-Movie function: Continuous data collection, storage and replay;
Multi-Analysis: Granularity and Roughness;
Tip Estimation and Image Re-construction;
Modularized design for convenience of maintenance and future upgrade;
Second display monitor and optical microscope system attachable;
Specifications
FunctionsAtomic Force Microscope (AFM) which has full coverage of Contacting Mode,
Tapping Mode, Phase Imaging and Lifting Mode;
Lateral Force Microscope (LFM);
Scanning Tunneling Microscope (STM);
Conductive AFM, SPM in liquid, Environmental Control SPM;
Nano-Processing System including Lithography Mode and Vector Scan Mode;
ResolutionAFM: 0.26nm lateral, 0.1nm vertical;
STM: 0.13nm lateral, 0.01nm vertical;
Technical
Parameters
Current Sensitivity: less than or equal to 10pA;
Force Sensitivity:less than or equal to 5pN;
Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048;
Scan Angle: 0-360 degree adjustable;
Scan Rate: 0.1-100Hz adjustable;
Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V;
Temperature Sensitivity: 0.1Celsius, Humidity Sensitivity: 0.5%RH;
Sample Size: Up to 50mmx50mm, 30mm thick;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm;
Online Control Software and offline Image Processing Software for Windows
Vista/XP/2000/9x;
ElectronicsCPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
DAC: 20 channels of 16-bit DAC;
ADC: 20 channels of 16-bit ADC;
Communication Interface: 10M/100M Fast Ethernet;
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